Technical Library

Methylsilane (1MS), dimethylsilane (2MS), trimethylsilane (3MS),tetramethylsilane (4MS) have been used in semiconductor manufacturing as precursors for the Chemical Vapor Deposition (CVD) of various layers, most often low dielectric constant (low-k) films. They also offer excellent barrier properties, typically used for a liner or a cap layer adjacent to other dielectric layers. These low-k layers vary in composition based on co-reactants combined with the methylsilanes and result in silicon carbide (SiC), silicon carbonitride (SiCN), and siliconoxyhydride (SiCO:H); the deposition reaction can typically be performed at relatively low temperature ranges.

  • 1MS and 2MS are utilized mostly for low volume deposition of SiC, SiCN, or SiCO:H depending on the conditions and precursors used.
  • 3MS has been used for SiC deposition or SiCO:H deposition, again depending on starting chemistries. This is a production-proven precursor, with current high volume application in semiconductor fabrication.
  • 4MS is currently used for SiC deposition on several advanced technology platforms and it is reported within several application patents.

Methyl Silanes

SKU Image Name Synonym Vapor_Pressure_3mm Boiling Point (°C / mm Hg) Melting Point (°C) Flashpoint (°C) Molecular Weight CAS
SIM6515.0 METHYLSILANE 1MS -- -57 -157° -- 46.14 --
SID4230.0 DIMETHYLSILANE 2MS -- -20 -150° -- 60.17 --
SIT8570.0 TRIMETHYLSILANE 3MS -- 6.7 -135.9° -- 74.2 --
SIT7555.0 TETRAMETHYLSILANE, 99+% 4MS -- 26.6-26.7 -99° -27 °C 88.22 --
SIT7541.0 1,1,2,2-TETRAMETHYLDISILANE 4M2S -- 86-87 -93° -26 °C 118.32 --
SIH6109.0 HEXAMETHYLDISILANE 6M2S -- 112-113 12-14° -1 °C 146.38 --
SIT7308.0 TETRAKIS(TRIMETHYLSILYL)SILANE 12M5S -- NA 267° sub.; 319-21° (sealed tube) -- 320.85 --